@misc{indiciae3df281b08760,
  title = {ML for Semiconductor Bond Pad Defect Detection.},
  author = {Galasso, Jennifer and Valdez, Skyler and Boone, William and Larson, Kurt},
  year = {2021},
  doi = {10.2172/1882316},
  url = {https://www.osti.gov/biblio/1882316},
  note = {Source identifier: 1882316}
}