TY  - RPRT
TI  - Application of Orthogonal Defect Classification for Software Reliability Analysis
AU  - Chen, Edward
AU  - Shorthill, Tate
AU  - Elks, Carl
AU  - Jayakumar, Athira Varma
AU  - Dinh, Nam
AU  - Bao, Han
PY  - 2022
UR  - https://www.osti.gov/biblio/1880260
ID  - 1880260
ER  -