@misc{indiciae572de3f2787e,
  title = {Using EBIC to Understand Radiation Damage in Electronics.},
  author = {Talin, Albert Alec and Ashby, David Scott and Marinella, Matthew J and Garland, Diana and Vizkelethy, Gyorgy and Celio, Kim and Cumings, John and Warecki, Zoey and Jillanas, Juan Pablo and Armstrong, Andrew and Allerman, Andrew A.},
  year = {2021},
  doi = {10.2172/1861021},
  url = {https://www.osti.gov/biblio/1861021},
  note = {Source identifier: 1861021}
}