@misc{indiciaec45f61c69979,
  title = {Differential electron yield imaging with STXM},
  author = {Hubbard, William A. and Lodico, Jared J. and Ling, Xin Yi and Zutter, Brian T. and Yu, Young-Sang and Shapiro, David A. and Regan, B. C.},
  year = {2020},
  doi = {10.1016/j.ultramic.2020.113198},
  url = {https://www.osti.gov/biblio/1844378},
  note = {Source identifier: 1844378}
}