@misc{indiciae8e23ca302f81,
  title = {Using EBIC to Understand Radiation Damage in Electronics.},
  author = {Talin, Albert Alec and Ashby, David Scott and Garland, Diana and Esposito, Madeline and Warecki, Zoey and Vizkelethy, Gyorgy and Llinas, Juan Pablo and Armstrong, Andrew and Cumings, John and Marinella, Matthew J},
  year = {2021},
  doi = {10.2172/1842659},
  url = {https://www.osti.gov/biblio/1842659},
  note = {Source identifier: 1842659}
}