@misc{indiciae2be45cde0ce1,
  title = {QA Testing of Si Diodes [Slides]},
  author = {Dowd, James Franklyn},
  year = {2021},
  doi = {10.2172/1832338},
  url = {https://www.osti.gov/biblio/1832338},
  note = {Source identifier: 1832338}
}