TY  - RPRT
TI  - Localized Defect Detection from Spatially Mapped, In-Situ Process Data With Machine Learning
AU  - Halsey, William
AU  - Rose, Derek
AU  - Scime, Luke
AU  - Dehoff, Ryan
AU  - Paquit, Vincent
PY  - 2021
DO  - 10.3389/fmech.2021.767444
UR  - https://www.osti.gov/biblio/1830272
ID  - 1830272
ER  -