@misc{indiciae4a03aa61c72f,
  title = {Localized Defect Detection from Spatially Mapped, In-Situ Process Data With Machine Learning},
  author = {Halsey, William and Rose, Derek and Scime, Luke and Dehoff, Ryan and Paquit, Vincent},
  year = {2021},
  doi = {10.3389/fmech.2021.767444},
  url = {https://www.osti.gov/biblio/1830272},
  note = {Source identifier: 1830272}
}