@misc{indiciaeb83af03aaed7,
  title = {Electronically induced defect creation at semiconductor/oxide interface revealed by time-dependent density functional theory},
  author = {Liu, Yue-Yang and Wei, Zhongming and Meng, Sheng and Wang, Runsheng and Jiang, Xiangwei and Huang, Ru and Li, Shu-Shen and Wang, Lin-Wang},
  year = {2021},
  doi = {10.1103/physrevb.104.115310},
  url = {https://www.osti.gov/biblio/1829061},
  note = {Source identifier: 1829061}
}