@misc{indiciaea60118c73082,
  title = {FPGA Reliability Test Design Using Parametric Degradation Analysis.},
  author = {Ozment, Seth James and Leonhardt, Darin and Grzybowski, Thomas Anthony and Fellows, Matthew Ward},
  year = {2020},
  url = {https://www.osti.gov/biblio/1812458},
  note = {Source identifier: 1812458}
}