TY  - RPRT
TI  - PARIS: Predicting application resilience using machine learning
AU  - Guo, Luanzheng
AU  - Li, Dong
AU  - Laguna, Ignacio
PY  - 2021
DO  - 10.1016/j.jpdc.2021.02.015
UR  - https://www.osti.gov/biblio/1806425
ID  - 1806425
ER  -