TY  - RPRT
TI  - Failure progression in the solid electrolyte interphase (SEI) on silicon electrodes
AU  - Guo, Kai
AU  - Kumar, Ravi (ORCID:0000000205955207)
AU  - Xiao, Xingcheng
AU  - Sheldon, Brian W. (ORCID:000000029593891X)
AU  - Gao, Huajian
PY  - 2020
DO  - 10.1016/j.nanoen.2019.104257
UR  - https://www.osti.gov/biblio/1799374
ID  - 1799374
ER  -