@misc{indiciaee47c41c0adad,
  title = {Solving electrical impedance tomography with deep learning},
  author = {Fan, Yuwei (ORCID:0000000195666996) and Ying, Lexing (ORCID:0000000315471457)},
  year = {2020},
  doi = {10.1016/j.jcp.2019.109119},
  url = {https://www.osti.gov/biblio/1775905},
  note = {Source identifier: 1775905}
}