@misc{indiciaef214d84073ca,
  title = {Gaussian process regression for radiological contamination mapping [Slides]},
  author = {Shin, Tony Heong Shick},
  year = {2021},
  doi = {10.2172/1760555},
  url = {https://www.osti.gov/biblio/1760555},
  note = {Source identifier: 1760555}
}