TY  - RPRT
TI  - Comparing smoothing techniques for extracting MOSFET threshold voltage
AU  - Stankus, Christopher
AU  - Ahmed, Moinuddin
PY  - 2019
DO  - 10.1016/j.sse.2019.107744
UR  - https://www.osti.gov/biblio/1606521
ID  - 1606521
ER  -