@misc{indiciaed4f8ca3fcbec,
  title = {Comparing Scanning Electron Microscope and Transmission Electron Microscope Grain Mapping Techniques Applied to Well-Defined and Highly Irregular Nanoparticles},
  author = {Mariano, Ruperto G. and Yau, Allison and McKeown, Joseph T. and Kumar, Mukul and Kanan, Matthew W.},
  year = {2020},
  doi = {10.1021/acsomega.9b03505},
  url = {https://www.osti.gov/biblio/1600045},
  note = {Source identifier: 1600045}
}