@misc{indiciae5988b38ef347,
  title = {Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reduction},
  author = {Ruggles, T. J. and Yoo, Y. S. J. and Dunlap, B. E. and Crimp, M. A. and Kacher, J.},
  year = {2019},
  doi = {10.1016/j.ultramic.2019.112927},
  url = {https://www.osti.gov/biblio/1593338},
  note = {Source identifier: 1593338}
}