@misc{indiciaed0fdeac16a0b,
  title = {Diffraction paradox: An unusually broad diffraction background marks high quality graphene},
  author = {Chen, S. and Horn von Hoegen, M. and Thiel, P. A. and Tringides, M. C.},
  year = {2019},
  doi = {10.1103/physrevb.100.155307},
  url = {https://www.osti.gov/biblio/1574018},
  note = {Source identifier: 1574018}
}