@misc{indiciae743f336e9171,
  title = {Advanced CMOS Radiation Effects Testing and Analysis},
  author = {Pellish, J. A. and Marshall, P. W. and Rodbell, K. P. and Gordon, M. S. and LaBel, K. A. and Schwank, J. R. and Dodds, N. A. and Castaneda, C. M. and Berg, M. D. and Kim, H. S. and Phan, A. M. and Seidleck, C. M.},
  year = {2014},
  url = {https://ntrs.nasa.gov/citations/20140017781},
  note = {Source identifier: 20140017781}
}