@misc{indiciaee8e8f79f339b,
  title = {Atomic Force Microscope for Imaging and Spectroscopy},
  author = {Pike, W. T. and Hecht, M. H. and Anderson, M. S. and Akiyama, T. and Gautsch, S. and deRooij, N. F. and Staufer, U. and Niedermann, Ph. and Howald, L. and Mueller, D.},
  year = {2000},
  url = {https://ntrs.nasa.gov/citations/20010020497},
  note = {Source identifier: 20010020497}
}