@misc{indiciaeb7f4616d3e33,
  title = {Test pattern generation for ILA sequential circuits},
  author = {Feng, YU and Frenzel, James F. and Maki, Gary K.},
  year = {1993},
  url = {https://ntrs.nasa.gov/citations/19940016634},
  note = {Source identifier: 19940016634}
}