TY  - RPRT
TI  - Single event test methodology for integrated optoelectronics
AU  - Label, Kenneth A.
AU  - Cooley, James A.
AU  - Stassinopoulos, E. G.
AU  - Marshall, Paul
AU  - Crabtree, Christina
PY  - 1993
UR  - https://ntrs.nasa.gov/citations/19930068909
ID  - 19930068909
ER  -