TY  - RPRT
TI  - Material property measurements with post-processed thermal image data
AU  - Welch, Christopher S.
AU  - Winfree, William P.
AU  - Heath, D. M.
AU  - Cramer, Elliott
AU  - Howell, Patricia
PY  - 1990
UR  - https://ntrs.nasa.gov/citations/19910066955
ID  - 19910066955
ER  -