@misc{indiciae1c816a2624bd,
  title = {Material property measurements with post-processed thermal image data},
  author = {Welch, Christopher S. and Winfree, William P. and Heath, D. M. and Cramer, Elliott and Howell, Patricia},
  year = {1990},
  url = {https://ntrs.nasa.gov/citations/19910066955},
  note = {Source identifier: 19910066955}
}