@misc{indiciaea5550a43493d,
  title = {Testing Electronic Devices for Single-Event Upset},
  author = {Nichols, D. K. and Price, W. E. and Malone, C. J.},
  year = {1986},
  url = {https://ntrs.nasa.gov/citations/19850000454},
  note = {Source identifier: 19850000454}
}