TY  - RPRT
TI  - Device failure analysis by scanning electron microscopy
AU  - Davies, I. G.
AU  - Shaw, D. A.
AU  - Sulway, D. V.
AU  - Thornton, P. R.
AU  - Wayte, R. C.
PY  - 1968
UR  - https://ntrs.nasa.gov/citations/19690006630
ID  - 19690006630
ER  -