@misc{indiciae84b623f88a67,
  title = {Device failure analysis by scanning electron microscopy},
  author = {Davies, I. G. and Shaw, D. A. and Sulway, D. V. and Thornton, P. R. and Wayte, R. C.},
  year = {1968},
  url = {https://ntrs.nasa.gov/citations/19690006630},
  note = {Source identifier: 19690006630}
}