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Zurasky, J. L.

Publications and source records attributed to Zurasky, J. L..

The Lageos satellite

The fundamental concept of Lageos is a long-lived, dense, electrically and mechanically inert spherical satellite with its surface speckled with retroreflecting cube corners, designed such that range measurements between duly equipped laser ground stations and the satellite are possible with an ultimate accuracy of 2 cm when data from a single satellite pass are appropriately averaged. The Lageos concept requires that the satellite be placed in an orbit for which an ephemeris can be determined ultimately to 5 cm rms uncertainty for a 24-hour arc. These required satellite characteristics should allow the several geodynamic motions experienced by ground stations to be determined typically with 2 cm accuracy.

Johnson, C. W.

Cube corner retroreflector test and analysis

Cube corner retroreflectors with nominal dihedral angles of 90 deg 0 min 1.5 sec were fabricated, tested, and analyzed to determine the return energy in the annular ring of the far field diffraction pattern required by the Laser Geodynamic Satellite. Performance was assessed for variations in the dihedral angles, optical surfaces, and thermal environment. Despite relatively high independent axial and radial sensitivities, the changes caused by the anticipated thermal environment were found to be negligible; however, there were substantial variations between the analytical predictions and measured performance.-

Zurasky, J. L.

Conceptual design of the scientific instrument arrangement for the large space telescope

A description of the scientific instrument arrangement for the large space telescope (LST) is given, with some of the rationale for selecting this concept. The first section of this report describes the basic configuration and was designed for an f/20 telescope focal plane. The subsequent LSTWG meeting held in November gave some redirection to the scientific requirements, and these changes are described in the section, Configuration Update.

Zurasky, J. L.

Monitoring deposition of films

A system using dual wavelength characteristics of light passing through a film being deposited was described to generate an output signal that changes rapidly at the point when the deposition process should stop or change. Photodetectors are used to sense the light intensity changes at the two wavelengths, and the monitored signal represents the ratio of their sums and difference signal strengths.

Zurasky, J. L.

Dual-wavelength system monitors deposition of films - A concept

System monitors fabrication of high-quality optical filters and other precise film deposition operations. System generates output signal of an element that changes rapidly when deposition process changes or stops, and eliminates defects of single-wavelength systems. Five additional advantages of dual-wavelength system are listed.

Zurasky, J. L.