Mitigating emissions and costs through demand-side solutions in Chinese residential buildings
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Science & Technology - Other Topics↗
Engineering topics
Zhang, Lulu
Publications and source records attributed to Zhang, Lulu.
Long-term variability of inorganic ions in TSP at a remote background site in Japan (Wajima) from 2005 to 2015
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Zhou, Quanyu (ORCID:0000000301361468)↗
A Method to Extract Spatially Resolved Polycyclic Aromatic Hydrocarbon Emission from Spitzer Spectra: Application to M51
The mid-infrared spectrum contains rich diagnostics to probe the physical properties of galaxies, among which the pervasive emission features from polycyclic aromatic hydrocarbons (PAHs) offer promising means of estimating the star formation rate (SFR) relatively immune from dust extinction. This paper investigates the effectiveness of PAH emission as a SFR indicator on subkiloparsec scales by studying the Spitzer/IRS mapping-mode observations of the nearby grand-design spiral galaxy M51. We present a new approach of analyzing the spatial elements of the spectral data cube that simultaneously maximizes spatial resolution and spatial coverage, while yielding reliable measurements of the total, integrated 5–20 μm PAH emission. We devise a strategy of extracting robust PAH emission using spectra with only partial spectral coverage, complementing missing spectral regions with properly combined mid-infrared photometry. We find that in M51 the PAH emission correlates tightly with the extinction-corrected far-ultraviolet, near-ultraviolet, and Hα emission, from scales of ∼0.4 kpc close to the nucleus to 6 kpc out in the disk of the galaxy, indicating that PAH serves as an excellent tracer of SFR over a wide range of galactic environments. But regional differences exist. Close to the active nucleus of M51 the 6.2 μm feature is weaker, and the overall level of PAH emission is suppressed. The spiral arms and the central star-forming region of the galaxy emit stronger 7.7 and 8.6 μm PAH features than the inter-arm regions.
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene
We report the results of a Versailles Project on Advanced Materials and Standards interlaboratory study on the intensity scale calibration of x-ray photoelectron spectrometers using low-density polyethylene (LDPE) as an alternative material to gold, silver, and copper. An improved set of LDPE reference spectra, corrected for different instrument geometries using a quartz-monochromated Al Kα x-ray source, was developed using data provided by participants in this study. Using these new reference spectra, a transmission function was calculated for each dataset that participants provided. When compared to a similar calibration procedure using the NPL reference spectra for gold, the LDPE intensity calibration method achieves an absolute offset of ~3.0% and a systematic deviation of ±6.5% on average across all participants. For spectra recorded at high pass energies (≥90 eV), values of absolute offset and systematic deviation are ~5.8% and ±5.7%, respectively, whereas for spectra collected at lower pass energies (<90 eV), values of absolute offset and systematic deviation are ~4.9% and ±8.8%, respectively; low pass energy spectra perform worse than the global average, in terms of systematic deviations, due to diminished count rates and signal-to-noise ratio. Differences in absolute offset are attributed to the surface roughness of the LDPE induced by sample preparation. We further assess the usability of LDPE as a secondary reference material and comment on its performance in the presence of issues such as variable dark noise, x-ray warm up times, inaccuracy at low count rates, and underlying spectrometer problems. In response to participant feedback and the results of the study, we provide an updated LDPE intensity calibration protocol to address the issues highlighted in the interlaboratory study. Finally, we also comment on the lack of implementation of a consistent and traceable intensity calibration method across the community of x-ray photoelectron spectroscopy (XPS) users and, therefore, propose a route to achieving this with the assistance of instrument manufacturers, metrology laboratories, and experts leading to an international standard for XPS intensity scale calibration.
36 MATERIALS SCIENCE↗