White, Timothy A. | Engineering Papers

DOE OSTI2024

Materials Characterization: A Primer for Solid Phase Processing Applications

The Pacific Northwest National Laboratory (PNNL) undertook the Materials Characterization, Prediction, and Control (MCPC) Laboratory Directed Research and Development (LDRD) Project to advance understanding of nuclear material processing and enable multifold acceleration in the development and qualification of new material systems produced via advanced manufacturing methods, such as solid phase processing, for use in national security and advanced energy applications (Smith 2021). As a two-year LDRD investment requiring focused research, the MCPC project applied only a subset of the wide range of available destructive and nondestructive characterization methods to provide data to the predictive modeling and data analytics tasks. The purpose of this report is to review a wide range of destructive and nondestructive characterization methods that are relevant in solid-phase processing (SPP) applications, but not necessarily applied in the MCPC Project as a guide to the planning of characterization activities in future research. Particular attention is given to measured characteristics that can correlate to other material characteristics, with a particular interest in nondestructive evaluation (NDE) that can be applied to samples obtained in the MCPC Project. Destructive examinations include tensile tests, optical and electron microscopy, micro-hardness, and residual stress tests. NDE tests include surface visual inspection, eddy current examination for cracks, 4-point potential drop, ultrasound, x-ray, and computed tomography.

36 MATERIALS SCIENCE↗

DOE OSTI2017

A single-pixel X-ray imager concept and its application to secure radiographic inspections

Imaging technology is generally considered too invasive for arms control inspections due to the concern that it cannot properly secure sensitive features of the inspected item. However, this same sensitive information, which could include direct information on the form and function of the items under inspection, could be used for robust arms control inspections. The single-pixel X-ray imager (SPXI) is introduced as a method to make such inspections, capturing the salient spatial information of an object in a secure manner while never forming an actual image. The method is built on the theory of compressive sensing and the single pixel optical camera. The performance of the system is quantified here using simulated inspections of simple objects. Measures of the robustness and security of the method are introduced and used to determine how such an inspection would be made which can maintain high robustness and security. In particular, it is found that an inspection with low noise (<1%) and high undersampling (>256×) exhibits high robustness and security.

Arms Control↗