Engineering topics

Weisskopf, M. C.

Publications and source records attributed to Weisskopf, M. C..

At least 73 records · Page 4

NASA NTRS1998

Calibration Results for the AXAF Flux Contamination Monitor

The AXAF Flux Contamination Monitor (FCM) serves the purposes of transferring the absolute flux calibration from the ground calibration at the X-Ray Calibration Facility (XRCF) to operation on orbit and of detecting any changes in molecular contamination of the High-Resolution Mirror Assembly (HRMA) between ground calibration and the post-launch activation. We describe the design, construction, and characterization of the FCM radioactive sources, and their placement on the Forward Contamination Cover (FCC). We present results from FCM measurements with the AXAF focal-plane instruments, particularly the AXAF CCD Imaging Spectrometer (ACIS), during the ground calibration phase at the XRCF in 1997. Finally, we describe the plans for FCM on-orbit measurements during observatory activation and for the subsequent analysis.

Elsner, R. F.↗

NASA NTRS1997

AXAF Detector Backgrounds Produced By Cosmic Ray Protons

One of the science instruments on the Advanced X-ray Astrophysics Facility (AXAF), planned for launch in 1998 into a highly elliptical (10,000 km x 140,000 km) orbit, is a microchannel plate High Resolution Camera (HRC). This detector is designed to provide imaging and spectroscopic observations of x-rays emitted by stellar sources in the 0.1 to 10 keV energy range. Described here are analyses made to determine the expected time-dependent detector background from prompt and delayed (activation) radiation initiated by galactic cosmic-ray (GCR) proton interactions in the spacecraft and payload. Numerical simulations were made using the coupled set of Monte Carlo radiation transport codes, analysis software, and data bases shown. The major codes are HETC for nucleon-meson transport, EGS for simulating electromagnetic cascades, and MORSE for low-energy (less than 15 MeV) neutron transport. The simulation follows the transport history of photons in the energy range from - 100 GeV down to approx. 0.1 keV due to gamma-ray sources from neutral pion decay, high-energy (spallation) collisions, and low-energy neutron inelastic scattering and capture reactions. Also included is radioisotope production and the tracking of gamma-rays, electrons, and positrons from induced radioactivity.

Armstrong, T. W.↗

NASA NTRS1997

Uses of continuum radiation in the AXAF calibration

X-ray calibration of the Advanced X-ray Astrophysics Facility (AXAF) observatory at the MSFC X-Ray Calibration Facility (XRCF) made novel use of the x-ray continuum from a conventional electron-impact source. Taking advantage of the good spectral resolution of solid-state detectors, continuum measurements proved advantageous in calibrating the effective area of AXAF's High-Resolution Mirror Assembly (HRMA) and in verifying its alignment to the XRCF's optical axis.

Kolodziejczak, J. J.↗

NASA NTRS1997

Calibration of the AXAF Observatory: Overview

The Advanced X-ray Astrophysics Facility (AXAF) will soon begin its exploration of the x-ray universe, providing unprecedented angular and spectral resolution. Also unprecedented is the ambitious goal of calibrating the AXAF observatory to an accuracy of a few percent. Toward this end, AXAF science and engineering teams undertook an extensive calibration program at component, subsystem, and system levels. This paper is an overview of the system-level calibration activities, conducted over the past year at the Marshall Space Flight Center (MSFC) X-Ray Calibration Facility (XRCF).

Weisskopf, M. C.↗

NASA NTRS1997

Graded Multilayers not Required for Hard-X-Ray Imaging

For a given x-ray optic, a graded-multilayer coating extends the energy response to higher energies. However, this does not imply that graded multilayers are required for efficient hard-x-ray focusing. Indeed, smaller x-ray optics using conventional coatings provide advantages - namely, greater effective area per unit mass, less diffractive scattering by surface micro-roughness, and demonstrated feasibility - over larger optics coated with multilayers.

Weisskopf, M. C.↗

NASA NTRS1997

Grazing Incidence Nickel Replicated Optics for Hard X-ray Telescopes

The requirements for future hard x-ray (up to 50 keV) telescopes are lightweight, high angular resolution optics with large collecting areas. Grazing incidence replicated optics are an excellent candidate for this, type of mission, providing better angular resolution, comparable area/unit mass, and simpler fabrication than multilayer-coated foils. Most importantly, the technology to fabricate the required optics currently exists. A comparison of several hard x-ray telescope designs will be presented.

Peturzzo, J. J., III↗

NASA NTRS1997

Graded Multilayers not Required for Hard X-ray Imaging!

For a given X ray optic, a graded-multilayer coating extends the energy response to higher energies. However, this does not imply that graded multilayers are required for efficient hard X ray focusing. Indeed, smaller X ray optics using conventional coatings provide advantages -- namely, greater effective area per unit mass, less diffractive scattering by surface micro-roughness, and demonstrated feasibility - over larger optics coated with multilayers.

Weisskopf, M. C.↗

NASA NTRS1997

Calibration of the AXAF Observatory: Overview

The Advanced X-ray Astrophysics Facility (AXAF) will soon begin its exploration of the X-ray universe, providing unprecedented angular and spectral resolution. Also unprecedented is the ambitious goal of calibrating the AXAF observatory to an accuracy of a few percent. Toward this end, AXAF science and engineering teams undertook an extensive calibration program at component, subsystem, and system levels. This paper is an overview of the system-level calibration activities, conducted over the past year at the Marshall Space Flight Center (MSFC) X-Ray Calibration Facility (XRCF).

Weisskopf, M. C.↗

NASA NTRS1997

Uses of Continuum Radiation in the AXAF Calibration

Kolodziejczak, J. J.↗

NASA NTRS1995

Advanced X-ray Astrophysics Facility (AXAF): An overview

The Advanced X-ray Astrophysics Facility (AXAF) is the x-ray component of NASA's Great Observatories. To be launched in late 1998, AXAF will provide unprecedented capabilities for high-resolution imaging, spectrometric imaging, and high-resolution disperse spectroscopy, over the x-ray band from about 0.1 keV to 10 keV. With these capabilities, AXAF observations will address many of the outstanding questions in astronomy, astrophysics, and cosmology.

Weisskopf, M. C.↗

NASA NTRS1994

Development of a Hybrid Gas Detector/Phoswich for Hard X-Ray Astronomy

A hybrid detector is under development for use as a balloon-borne instrument in hard x-ray astronomy. The detector provides broad band coverage by coupling an optical avalanche chamber to a phoswich. The optical avalanche chamber yields superior instrument response at low energies while the scintillator takes over at the higher energies where the gas becomes transparent: at 25 keV, the addition of the gas chamber improves the energy resolution by a factor of 2.5 and the spatial resolution by a factor of 10 as compared to the stand-alone response of the phoswich. A half-scale prototype instrument is being constructed for test purposes and to help resolve a number of design questions involving the coupling of the two components.

Pimperl, M. M.↗

NASA NTRS1994

The Imaging Properties of a Silicon Wafer X-Ray Telescope

Silicon wafers have excellent optical properties --- low microroughness and good medium-scale flatness --- which Make them suitable candidates for inexpensive flat-plate grazing-incidence x-ray mirrors. On short spatial scales (less than 3 mm) the surface quality of silicon wafers rivals that expected of the Advanced X-Ray Astrophysics Facility (AXAF) high-resolution optics. On larger spatial scales, however, performance may be degraded by the departure from flatness of the wafer and by distortions induced by the mounting scheme. In order to investigate such effects, we designed and constructed a prototype silicon-wafer x-ray telescope. The device was then tested in both visible light and x rays. The telescope module consists of 94 150-mm-diameter wafers, densely packed into the first stage of a Kirkpatrick-Baez configuration. X-ray tests at three energies (4.5, 6.4, and 8.0 keV) showed an energy-independent line spread function with full width at half maximum (FWHM) of 150 arcseconds, dominated by deviations from large-scale flatness.

Joy, M. K.↗

NASA NTRS1993

A Hybrid Gas Detector/Phoswich for Hard X-ray Astronomy

A hybrid detector, which combines an optical avalanche chamber with a phoswich, is currently under development. The optical avalanche chamber - a proportional counter designed to give large quantities of light photons during charge multiplication, mounts on the front of the scintillator and gives response at low energies, while the solid scintillator takes over at energies where the gas becomes transparent (greater than 90 keV). Both sections of the hybrid will be read out by a common set of photomultipliers under the phoswich. The addition of the gas section to the phoswich improves the energy resolution of the instrument by a factor of 2.5 at 25 keV and the spatial resolution by a factor of 10 at the same energy. The net result is an instrument with broad band coverage and high sensitivity which will be used for coded aperture imaging on long duration balloon flights.

Ramsey, B. D.↗

NASA NTRS1993

Molecular contamination and the calibration of AXAF

By the end of this decade, the two missions comprising the Advanced X-ray Astrophysics Facility (AXAF) will become the X-ray component of NASA's Great Observatories. In order to meet some of the ambitious scientific objectives, the AXAF team plans to calibrate the telescopes and instruments to an accuracy of a few percent. Particulate and molecular contamination potentially limit this precision, because they would likely change between ground calibration and orbital operation. To avoid this requires careful control over procedures affecting the coated optical surfaces, to ensure that neither particulate nor molecular contamination compromise the calibration. In particular, the fractional areal coverage by particulates or condensed droplets must be less than 0.005 projected onto the aperture plane; the thickness of any molecular film must be less than a few tens of angstrom.

Elsner, R. F.↗

NASA NTRS1993

Evidence for dust contamination on the VETA-1 mirror surface

Relative surface brightness data from the VETA-1 test displayed an energy dependence which was inconsistent with models which assume surface roughness is the only cause of scattering. A means of separating an in-plane component of scattering caused by surface roughness from an azimuthally symmetric component, which is expected from dust, was afforded by images taken while only single quarters of the mirror surface were exposed. In this case, in-plane scattered X-rays should populate only opposing 90 deg azimuthal quadrants of an image centered on the focal point. As such, this approach is a novel, high sensitivity test for detecting extremely small (about 10 exp -5) fractional dust coverage on X-ray optics. Comparison of in-plane and out-of-plane quadrants in these tests indicated that most of the scattered data were azimuthally symmetric, and that the symmetric component was enhanced at lower energies. Both results support a model which invokes the wing scan results with a combination of dust and surface roughness induced scattering. The extent to which parameters such as the mirror surface roughness, dust size distribution, spatial distribution, and density may be determined using this approach is also discussed.

Kolodziejeczak, J. J.↗

NASA NTRS1993

X-ray evidence for particulate contamination on the AXAF VETA-1 mirrors

X-ray testing of the AXAF outer mirror pairs, in the VETA-1 configuration, reveals a point spread function (PSF) with unexpectedly large wings at low energies. Although the angular dependence in the wings of the PSF is close to that expected for diffractive scattering from surface roughness, the energy dependence differs substantially. Analyses of the observed X-ray PSF, images near ring focus, and single-quadrant images at conjugate focus suggest that the excess scattering observed at low X-ray energies results from diffractive scattering by relatively small grains (as small as a few tenths micrometer in radius). We develop a simple model for the contribution of scattering by particulates to the PSF. Merging this model with that for scattering by surface roughness, we fit the combined model to the observed energy-dependent PSF, in order to estimate parameters and associated uncertainties characterizing the grain-size distribution and the surface-roughness power spectral density. In particular, we find that the fractional coverage of the mirrors by particulates is approximately 1 x 10 exp -4 (for grain radii between 0.1 and 10 microns), and that the rms surface-roughness is approximately 0.7 nm (for spatial frequencies between 1/mm and 1000/mm).

O'Dell, S. L.↗

NASA NTRS1993

The X-ray reflectivity of the AXAF VETA-I optics

The study measures the X-ray reflectivity of the AXAF VETA-I optic and compares it with theoretical predictions. Measurements made at energies of 0.28, 0.9, 1.5, 2.1, and 2.3 keV are compared with predictions based on ray trace calculations. Results on the variation of the reflectivity with energy as well as the absolute value of the reflectivity are presented. A synchrotron reflectivity measurement with a high-energy resolution over the range 0.26 to 1.8 keV on a flat Zerodur sample is also reported. Evidence is found for contamination of the flat by a thin layer of carbon on the surface, and the possibility of alteration of the surface composition of the VETA-I mirror, perhaps by the polishing technique. The overall agreement between the measured and calculated effective area of VETA-I is between 2.6 and 10 percent. Measurements at individual energies deviate from the best-fitting calculation to 0.3 to 0.8 percent, averaging 0.6 percent at energies below the high energy cutoff of the mirror reflectivity, and are as high as 20.7 percent at the cutoff.

Kellogg, E.↗

NASA NTRS1992

The x ray reflectivity of the AXAF VETA-I optics

The x-ray reflectivity of the VETA-I optic, the outermost shell of the AXAF x-ray telescope, with a bare Zerodur surface, is measured and compared with theoretical predictions. Measurements made at energies of 0.28, 0.9, 1.5, 2.1, and 2.3 keV are compared with predictions based on ray trace calculations. The data were obtained at the x-ray calibrations facility at Marshall Space Flight Center with an electron impact x-ray source located 528 m from the grazing incidence mirror. The source used photoelectric absorption filters to eliminate bremsstrahlung continuum. The mirror has a diameter of 1.2 m and a focal length of 10 m. The incident and reflected x-ray flux are detected using two proportional counters, one located in the incident beam of x-rays at the entrance aperture of the VETA-I, and the other in the focal plane behind an aperture of variable size. Results on the variation of the reflectivity with energy as well as the absolute value of the reflectivity are presented. We also present a synchrotron reflectivity measurement with high energy resolution over the range 0.26 to 1.8 keV on a flat Zerodur sample, done at NSLS. We present evidence for contamination of the flat by a thin layer of carbon on the surface, and the possibility of alteration of the surface composition of the VETA-I mirror perhaps by the polishing technique. The overall agreement between the measured and calculated effective area of VETA-I is between 2.6 percent and 10 percent, depending on which model for the surface composition is adopted. Measurements at individual energies deviate from the best-fitting calculation to 0.3 to 0.8 percent, averaging 0.6 percent at energies below the high energy cutoff of the mirror reflectivity, and are as high as 20.7 percent at the cutoff. We also discuss the approach to the final preflight calibration of the full AXAF flight mirror.

Kellogg, Edwin M.↗