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Wan, Wenjie

Publications and source records attributed to Wan, Wenjie.

Nonlinear negative refraction by difference frequency generation

Negative refraction has attracted much interest for its promising capability in imaging applications. Such an effect can be implemented by negative index meta-materials, however, which are usually accompanied by high loss and demanding fabrication processes. Recently, alternative nonlinear approaches like phase conjugation and four wave mixing have shown advantages of low-loss and easy-to-implement, but associated problems like narrow accepting angles can still halt their practical applications. Here, we demonstrate theoretically and experimentally a scheme to realize negative refraction by nonlinear difference frequency generation with wide tunability, where a thin Beta barium borate slice serves as a negative refraction layer bending the input signal beam to the idler beam at a negative angle. Furthermore, we realize optical focusing effect using such nonlinear negative refraction, which may enable many potential applications in imaging science.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Reconstruction of nonlinear wave propagation

Disclosed are systems and methods for characterizing a nonlinear propagation environment by numerically propagating a measured output waveform resulting from a known input waveform. The numerical propagation reconstructs the input waveform, and in the process, the nonlinear environment is characterized. In certain embodiments, knowledge of the characterized nonlinear environment facilitates determination of an unknown input based on a measured output. Similarly, knowledge of the characterized nonlinear environment also facilitates formation of a desired output based on a configurable input. In both situations, the input thus characterized and the output thus obtained include features that would normally be lost in linear propagations. Such features can include evanescent waves and peripheral waves, such that an image thus obtained are inherently wide-angle, farfield form of microscopy.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗