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Von Roos, O.

Publications and source records attributed to Von Roos, O..

At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS1981

The 'depletion layer' of amorphous p-n junctions

It is shown that within reasonable approximations for the density of state distribution within the mobility gap of a:Si, a one-to-one correspondence exists between the electric field distribution in the transition region of an amorphous p-n junction and that in the depletion layer of a crystalline p-n junction. Thus it is inferred that the depletion layer approximation which leads to a parabolic potential distribution within the depletion layer of crystalline junctions also constitutes a fair approximation in the case of amorphous junctions. This fact greatly simplifies an analysis of solid-state electronic devices based on amorphous material (i.e., solar cells).

Von Roos, O.↗
NASA NTRS1980

The generation of electron hole pairs in very thin solar cells possessing an optical back-surface reflector

It is pointed out that very thin solar cells (1 micron thick or less) as, for example, amorphous silicon or cadmium sulfide cells, possessing a back surface reflector should be regarded as Fabry-Perot cavities as far as the generation of electron-hole pairs by light is concerned. The generation rate of electron-hole pairs as a function of distance from the front surface exhibits characteristic interference patterns which are not negligible and must be accounted for in an analysis of the performance of such a cell.

Von Roos, O.↗
NASA NTRS1980

Determination of deep level capture cross sections in wide band-gap semiconductors by means of an electron beam

The paper presents a general theory for the determination of the short circuit current generated by a sinusoidally amplitude-modulated electron beam in the presence of recombination centers with an arbitrary number of charge states. It is shown that a measurement of the coherent phase shift with respect to the incident beam as a function of the modulation frequency of the beam ascertains the magnitudes of electron and hole capture cross sections. The surface exposed to the electron beam must have a negligible surface recombination velocity for the measurements to be unambiguous.

Von Roos, O.↗
NASA NTRS1980

The influence of a voltage ramp on the measurement of I-V characteristics of a solar cell

For efficiency and convenience the voltage applied to a Si solar cell is often fairly rapidly driven from zero to the open circuit value typically at a common rate of 1 V per millisecond. During this time the values of current are determined as a function of the instantaneous voltage thus producing an I-V characteristic. The present paper shows that the customary expressions for the current as a function of cell parameters still remain valid provided that the diffusion length in the expression for the dark current is changed from its steady state value L to the effective diffusion length L1 given by L1 = L(1 + qV/kT.tau) to the -1/2, where V is the ramp rate considered constant and tau is the lifetime of minority carriers. This result is true to a very good approximation provided that low level injection prevails.

Von Roos, O.↗
NASA NTRS1980

The spectral response of a front surface field solar cell

A calculation of the short-circuit current as a function of wavelength of the incident light, induced in a front surface field solar cell, is presented. The cell consists of a P(+)-P-N(+) junction. The electric field present in the P(+) layer situated at the front surface (the surface exposed to the sun) boosts the minority carrier collection at the P-N(+) junction sufficiently to make this structure a viable alternative to ordinary solar cells. A distinct advantage derives from the placement of all ohmic contacts on the back-surface facilitating array assemblage.

Von Roos, O.↗
NASA NTRS1980

The determination of transport parameters of minority carriers in n-p junctions by means of an electron microscope - Critique of recent developments

It has recently been shown that amplitude modulated electron beams provide a novel means for the determination of minority carrier lifetimes, diffusion lengths, etc., in n-p junctions. In this paper it is shown that: (1) a recently published analysis based on a cylindrically symmetric configuration is incorrect, (2) the correct approach leads to a system of dual integral equations for which the formal solution is given, (3) in general, the short circuit current can only be determined by means of extensive computer calculations except in the case of large front surface recombination velocities, and (4) the difficulties encountered with cylindrically symmetric configurations (circular ohmic contacts and the like) are completely avoided with a choice of a planar geometry since simple closed form expressions for the short circuit current are readily available in this case.

Von Roos, O.↗
NASA NTRS1979

Analysis of the interaction of an electron beam with a solar cell. III - The effect of spacial variations of the number density of recombination centers on SEM measurements

By means of an exactly soluble model the short circuit current generated by a scanning electron microscope in a P-N junction has been determined in cases where the trap density is inhomogeneous. The diffusion length for minority carriers becomes then dependent on the spacial coordinates. It is shown that in this case the dependence of the Isc on characteristic parameters as cell thickness, distance of the beam excitation spot from ohmic contacts, etc., becomes very intricate. This fact precludes the determination of the local diffusion length in the usual manner. Although the model is somewhat simplified in order to make it amenable to exact solutions, it is nevertheless realistic enough to lead to the conclusion that SEM measurements of bulk transport parameters in inhomogeneous semiconductor material are impractical since they may lead to serious errors in the interpretation of the data by customary means.

Von Roos, O.↗
NASA NTRS1979

A simple theory of back-surface-field /BSF/ solar cells

An earlier calculation of the I-V characteristics of solar cells contains a mistake. The current generated by light within the depletion layer is too large by a factor of 2. When this mistake is corrected, not only are all previous conclusions unchanged, but the agreement with experiment becomes better. Results are presented in graphical form of new computations which not only take account of the factor of 2, but also include more recent data on material parameters.

Von Roos, O.↗
NASA NTRS1979

A note on photocurrents in extrinsic semiconductors

The advent of the concept of holes and careful determination of mobilities have made it possible to realize that the potential difference between the contacts of an irradiated semiconductor in the absence of current flow is due to the difference in mobility of electrons and holes. In this paper, a preliminary analysis shows that charge neutrality and zero-current condition are compatible. This situation is clarified and it is found that the equation for the electric field E in the absence of current is not absolutely correct even under low-level injection conditions. In particular, it is shown that fairly large currents can be generated by suitable light sources, currents which are entirely due to the disparity between electron and hole mobilities.

Von Roos, O.↗
NASA NTRS1979

On the determination of diffusion lengths by means of angle-lapped p-n junctions

A standard procedure for determining the minority carrier diffusion length by means of SEM consists of scanning an angle-lapped surface of a p-n junction and measuring the resulting short circuit current as a function of beam position. The present paper points out that the usual expression linking the short circuit current induced by the electron beam to the angle between the semiconductor surface and the junction plane is incorrect. The correct expression is discussed and it is noted that, for angles less than 10 deg, the new and the old expression are practically indistinguishable.

Von Roos, O.↗
NASA NTRS1978

Quantum nondemolition measurements - Comment on recent developments

The limitations of the detectability of extremely weak signals (gravitational radiation for instance) imposed by Heisenberg's uncertainty principle on the sequential determination of those signals have been explored recently. A variety of schemes have been proposed to circumvent these limitations. Although all of the earlier attempts have been proven fruitless a recent proposal seems to be quite promising. The scheme, consisting of two harmonic oscillators interacting with each other in a peculiar way, allows for an exact analytical solution which is derived here. If it can be assumed that the expectation value of one of the canonical variables of the total system suffices to monitor the weak signal it can be shown that, in the absence of thermal noise, arbitrarily weak signals can in principle be measured without interference from the uncertainty principle.

Von Roos, O.↗
NASA NTRS1978

Analysis of the interaction of an electron beam with a solar cell. I. II

The short-circuit current generated by the electron beam of a scanning electron microscope when it impinges on the N-P junction of a solar cell is known to be dependent on the configuration used to investigate the cell's response, and the situation for one specific configuration is analyzed. This configuration is the case in which the highly collimated electron beam strikes the edge of a planar junction a variable distance away from the edge of the depletion layer. An earlier treatment is generalized to encompass the ohmic contact at the back surface. The analysis employing Fourier and Wiener-Hopf techniques shows that it is impractical to determine the bulk diffusion length of a solar cell by a SEM used in the studied configuration unless the ohmic contact is partially removed.

Von Roos, O.↗
NASA NTRS1978

A simple theory of back surface field /BSF/ solar cells

A theory of an n-p-p/+/ junction is developed, entirely based on Shockley's depletion layer approximation. Under the further assumption of uniform doping the electrical characteristics of solar cells as a function of all relevant parameters (cell thickness, diffusion lengths, etc.) can quickly be ascertained with a minimum of computer time. Two effects contribute to the superior performance of a BSF cell (n-p-p/+/ junction) as compared to an ordinary solar cell (n-p junction). The sharing of the applied voltage among the two junctions (the n-p and the p-p/+/ junction) decreases the dark current and the reflection of minority carriers by the builtin electron field of the p-p/+/ junction increases the short-circuit current. The theory predicts an increase in the open-circuit voltage (Voc) with a decrease in cell thickness. Although the short-circuit current decreases at the same time, the efficiency of the cell is virtually unaltered in going from a thickness of 200 microns to a thickness of 50 microns. The importance of this fact for space missions where large power-to-weight ratios are required is obvious.

Von Roos, O.↗
NASA NTRS1978

Recombination-generation currents in degenerate semiconductors

The classical Shockley-Read-Hall theory of free carrier recombination and generation via traps is extended to degenerate semiconductors. A concise and simple expression is found which avoids completely the concept of a Fermi level, a concept which is alien to nonequilibrium situations. Assumptions made in deriving the recombination generation current are carefully delineated and are found to be basically identical to those made in the original theory applicable to nondegenerate semiconductors.

Von Roos, O.↗
NASA NTRS1977

Quantum statistical theory of semiconductor junctions in thermal equilibrium

Free carrier and electric field distributions of one-dimensional semiconductor junctions are evaluated using a quantum mechanical phase-space distribution and its corresponding Boltzmann equation. Attention is given to quantum and exchange corrections in cases of high doping concentrations when carrier densities become degenerate. Quantitative differences between degenerate and classical junction characteristics, e.g., maximum electric field and built-in voltage and carrier concentration within the transition region, are evaluated numerically.

Von Roos, O.↗
NASA NTRS1977

A note on the assumption of quasiequilibrium in semiconductor junction devices

It is shown that the quasi-equilibrium theory for p-n junctions, as originally proposed by Shockley (1949), does not apply under conditions involving an application of comparatively low external voltages. A numerical example indicates that the quasi-equilibrium assumption must be discarded as soon as the voltage is increased beyond a certain critical value, although the system may still be in a low-level injection regime. It is currently not known which set of simplifying assumptions may replace the quasi-equilibrium assumptions. Possible analytic simplification relations applicable to moderate or high injection levels can, perhaps, be based on an approach considered by Mari (1968) and Choo (1971, 1972).

Von Roos, O.↗