Engineering topics

Vaughan, Roger K.

Publications and source records attributed to Vaughan, Roger K..

3 records

NASA NTRS2011

Lightning Pin Injection Test: MOSFETS in "ON" State

The test objective was to evaluate MOSFETs for induced fault modes caused by pin-injecting a standard lightning waveform into them while operating. Lightning Pin-Injection testing was performed at NASA LaRC. Subsequent fault-mode and aging studies were performed by NASA ARC researchers using the Aging and Characterization Platform for semiconductor components. This report documents the test process and results, to provide a basis for subsequent lightning tests. The ultimate IVHM goal is to apply prognostic and health management algorithms using the features extracted during aging to allow calculation of expected remaining useful life. A survey of damage assessment techniques based upon inspection is provided, and includes data for optical microscope and X-ray inspection. Preliminary damage assessments based upon electrical parameters are also provided.

Ely, Jay J.↗

NASA NTRS2009

Lightning Pin Injection Testing on MOSFETS

Lightning transients were pin-injected into metal-oxide-semiconductor field-effect transistors (MOSFETs) to induce fault modes. This report documents the test process and results, and provides a basis for subsequent lightning tests. MOSFETs may be present in DC-DC power supplies and electromechanical actuator circuits that may be used on board aircraft. Results show that unprotected MOSFET Gates are susceptible to failure, even when installed in systems in well-shielded and partial-shielded locations. MOSFET Drains and Sources are significantly less susceptible. Device impedance decreased (current increased) after every failure. Such a failure mode may lead to cascading failures, as the damaged MOSFET may allow excessive current to flow through other circuitry. Preliminary assessments on a MOSFET subjected to 20-stroke pin-injection testing demonstrate that Breakdown Voltage, Leakage Current and Threshold Voltage characteristics show damage, while the device continues to meet manufacturer performance specifications. The purpose of this research is to develop validated tools, technologies, and techniques for automated detection, diagnosis and prognosis that enable mitigation of adverse events during flight, such as from lightning transients; and to understand the interplay between lightning-induced surges and aging (i.e. humidity, vibration thermal stress, etc.) on component degradation.

Ely, Jay J.↗

NASA NTRS1991

Experimental measurements of Space Station antenna patterns at 60 GHz for EM analysis verification

Complex body scattering is a major problem facing the electromagnetic researcher today. Computer codes are one important method for predicting such scattering. With funding from Langley, Ohio State University has developed such a code. A 30:1 scale model of the Space Station was constructed to be used as a scattering target in the verification of this code. The purpose here is to document the methods used to make these measurements and present the results which will be used by others for code verification.

Young, W. Robert↗