Engineering topics
Publications and source records attributed to Vanzetti, R..
Infrared microscope instrument measures and plots the infrared profile of semiconductor chips, transistors and integrated circuits. Infrared analyses yields information on electrical and physical properties, enabling manufacturing improvements in semiconductor performance and reliability. Operational performance and main sections of the instrument are given.
Fast scan infrared detection and measuring instrument to predict failure of power transistors
Two rotating wheels in orthogonal relationship with helicoidal reflecting surfaces mounted on their outer rims achieve a linear speed without normal time loss in their return motion. The pitch of the helicoidal surfaces equals the displacement that the mirrors must traverse.
Fast scanning IR microscope for semiconductor evaluation used for engineering design analysis, reliability improvement, failure analysis, etc
Optics, scan, detector, and product design of fast scan infrared detection and measuring instrument