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Underwood, Steve D.

Publications and source records attributed to Underwood, Steve D..

Apparatus for Leak Testing Pressurized Hoses

A hose-attaching apparatus for leak-testing a pressurized hose may include a hose-attaching member. A bore may extend through the hose-attaching member. An internal annular cavity may extend coaxially around the bore. At least one of a detector probe hole and a detector probe may be connected to the internal annular cavity. At least a portion of the bore may have a diameter which is at least one of substantially equal to and less than a diameter of a hose to be leak-tested.

Underwood, Steve D.↗

Verification of International Space Station Component Leak Rates by Helium Accumulation Method

Discovery of leakage on several International Space Station U.S. Laboratory Module ammonia system quick disconnects (QDs) led to the need for a process to quantify total leakage without removing the QDs from the system. An innovative solution was proposed allowing quantitative leak rate measurement at ambient external pressure without QD removal. The method utilizes a helium mass spectrometer configured in the detector probe mode to determine helium leak rates inside a containment hood installed on the test component. The method was validated through extensive developmental testing. Test results showed the method was viable, accurate and repeatable for a wide range of leak rates. The accumulation method has been accepted by NASA and is currently being used by Boeing Huntsville, Boeing Kennedy Space Center and Boeing Johnson Space Center to test welds and valves and will be used by Alenia to test the Cupola. The method has been used in place of more expensive vacuum chamber testing which requires removing the test component from the system.

Underwood, Steve D.↗

Atomic Oxygen Effects on Seal Leakage

Common Berthing Mechanism (CBM provides the structural interface between separate International Space Station (ISS) elements, such as the Laboratory and Node modules. The CBM consists of an active and a passive half that join together with structural bolts. The seal at this interface is the CBM-to-CBM molded seal. The CBM-to-CBM interface is assembled on orbit, thus the seals can be exposed to the space environment for up to 65 hours. Atomic Oxygen/Vacuum Ultraviolet radiation (AO/VUV) in space is a potential hazard to the seals. Testing was conducted to determine the effect on leakage of the CBM-to-CBM seal material exposed to AO/VUV. The sealing materials were S383 silicone and V835 fluorocarbon material. Control samples, which were not exposed to the AO/VUV environment, were used to ensure that ff any changes in leakage occurred, they could be attributed to the AO/VUV exposure. After exposure to the AO/VUV environment the leakage increase was dramatic for the fluorocarbon. This testing was a major contributing factor in selecting silicone as the CBM-to-CBM seal material.

Christensen, John R.↗

Atomic Oxygen Effects on Seal Leakage

Common Berthing Mechanism (CBM) provides the structural interface between separate International Space Station (ISS) elements, such as the Laboratory and Node modules. The CBM consists of an active and a passive half that join together with structural bolts. The seal at this interface is the CBM-to-CBM molded seal. The CBM-to-CBM interface is assembled on orbit, thus the seals can be exposed to the space environment for up to 65 hours. Atomic Oxygen/Vacuum Ultraviolet radiation (AO/VUV) in space is a potential hazard to the seals. Testing was conducted to determine the effect on leakage of the CBM-to-CBM seal material exposed to AO/VUV. The sealing materials were S383 silicone and V835 fluorocarbon material. Control samples, which were not exposed to the AO/VUV environment, were used to ensure that if any changes in leakage occurred, they could be attributed to the AO/VUV exposure. After exposure to the AO/VUV environment the leakage increase was dramatic for the fluorocarbon. This testing was a major contributing factor in selecting silicone as the CBM-to-CBM seal material.

Christensen, John R.↗