Fault Identification in Crystalline Silicon PV Modules by Complementary Analysis of the Light and Dark Current-Voltage Characteristics
Explore the source record for details and available documents.
Engineering topics
Publications and source records attributed to Teodorescu, Remus.
Explore the source record for details and available documents.
Explore the source record for details and available documents.
This article proposes a method for quantifying the percentage of partially and totally disconnected solar cell cracks by analyzing electroluminescence images of the photovoltaic module taken under high- and low-current forward bias. The method is based on the analysis of the module's electroluminescence intensity distribution, applied at module and cell level. These concepts are demonstrated on a crystalline silicon photovoltaic module that was subjected to several rounds of mechanical loading and humidity-freeze cycling, causing increasing levels of solar cell cracks. The proposed method can be used as a diagnostic tool to rate cell damage or quality of modules after transportation. Moreover, the method can be automated and used in quality control for module manufacturers, installers, or as a diagnostic tool by plant operators and diagnostic service providers.
Explore the source record for details and available documents.