Engineering Papers⌕ Search

Engineering topics

Tanbakuchi, Anthony

Publications and source records attributed to Tanbakuchi, Anthony.

Report on High Energy Arcing Fault Experiments

This report documents an experimental program designed to investigate High Energy Arcing Fault (HEAF) phenomena for medium voltage electrical switchgear containing aluminum conductors. This report covers full-scale laboratory experiments using representative nuclear power plant (NPP) three-phase electrical equipment. Electrical, thermal, and pressure data were recorded for each experiment and documented in this report. This report covers four of the fourteen planned medium voltage electrical enclosure experiments. Subsequent reports will document the additional experiments performed in the future. The experiments were performed at KEMA Labs located in Chalfont, Pennsylvania. The experimental design, setup, and execution were completed by staff from the United States Nuclear Regulatory Commission (NRC), the National Institute of Standards and Technology (NIST), Sandia National Laboratories (SNL) and KEMA. In addition, representatives from the Electric Power Research Institute (EPRI) observed some of the experimental setups and execution. The HEAF experiments were performed on four near-identical units of General Electric metal-clad medium voltage switchgear. The three-phase arcing fault was initiated on the primary cable connection bus. All four experiments used the same system voltage (6.9 kV) but varied the current and duration. Real-time electrical operating conditions, including voltage, current and frequency, were measured during the experiments. Heat fluxes and incident energies were measured with plate thermometers and slug calorimeters at various locations around the electrical enclosures. Internal enclosure pressures were measured during the experiments. The experiments were documented with normal and high-speed videography, infrared imaging, and photography. Insights from the experimental series included timing information related to enclosure breach, event progression, mass loss measurements for electrodes and steel enclosures, peak pressure rise, particle analysis, along with visual and thermal imaging data to better understand and characterize the hazard. These results will be used in subsequent efforts to advance the state of knowledge related to HEAF.

42 ENGINEERING↗

Optical Imaging on Z LDRD: Design and Development of Self-Emission and Debris Imagers

We present an overview of the design and development of optical self-emission and debris imaging diagnostics for the Z Machine at Sandia National Laboratories. These diagnostics were designed and implemented to address several gaps in our understanding of visibly emitting phenomenon on Z and the post-shot debris environment. Optical emission arises from plasmas that form on the transmission line that delivers energy to Z loads and on the Z targets themselves; however, the dynamics of these plasmas are difficult to assess without imaging data. Addressing this, we developed a new optical imager called SEGOI (Self-Emission Gated Optical Imager) that leverages the eight gated optical imagers and two streak cameras of the Z Line VISAR system. SEGOI is a low cost, side-on imager with a 1 cm field of view and 30-50 µm spatial resolution, sensitive to green light (540-600 nm). This report outlines the design considerations and development of this diagnostic and presents an overview of the first diagnostic data acquired from four experimental campaigns. SEGOI was fielded on power flow experiments to image plasmas forming on and between transmission lines, on an inertial confinement fusion experiment called the Dynamic Screw Pinch to image low density plasmas forming on return current posts, on an experiment designed to measure the magneto Rayleigh-Taylor instability to image the instability bubble trajectory and self-emission structures, and finally on a Magnetized Liner Inertial Fusion (MagLIF) experiment to image the emission from the target. The second diagnostic developed, called DINGOZ (Debris ImagiNG on Z), was designed to improve our understanding of the post-shot debris environment. DINGOZ is an airtight enclosure that houses electronics and batteries to operate a high-speed (10-400 kfps) camera in the Z Machine center section. We report on the design considerations of this new diagnostic and present the first high-speed imaging data of the post-shot debris environment on Z.

42 ENGINEERING↗