Engineering topics

TamizhMani, Govindasamy

Publications and source records attributed to TamizhMani, Govindasamy.

8 records

DOE OSTI2023

Susceptibility to polarization type potential induced degradation in commercial bifacial p-PERC PV modules

Potential induced degradation (PID) is a reliability issue affecting photovoltaic (PV) modules, mainly when PV strings operate under high voltages in hot/humid conditions. Polarization-type PID (PID-p) has been known to decrease module performance quickly. PID-p can be reduced or recovered under the light in some cases, but this effect, as expected, would be less pronounced on the rear side of bifacial PV modules receiving lower irradiance. As bifacial PV modules are projected to dominate the PV market within the next 10 years, it is crucial to understand the PID-p issue in bifacial modules better. In this study, we performed indoor PID testing to induce PID-p on 14 commercial bifacial p-PERC modules with three different module constructions from three manufacturers. Here, four rounds (+ve and –ve polarities for front and rear sides) of PID testing are done at 25°C, 54% relative humidity (RH) for 168 h using the aluminum foil method. Each module side (front cell side and back cell side) is tested individually under both negative and positive voltage bias. The results show that the highest degradation of 32% in maximum power (Pmax) at standard test conditions (1000 W/m 2 ) and 51% at low irradiance (200 W/m 2 ) has been observed in some cases. Recovery under sunlight is also done, and outcomes show a near-complete recovery in Pmax. This study presents an extensive experimental methodology and a detailed analysis to systematically and simultaneously/sequentially evaluate multiple construction types of bifacial modules to the PID-p susceptibility and recovery.

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DOE OSTI2023

A study of Cell Cracks Formation During Freight Shipping : Monitoring Shock and Temperature in Real-Time & Assessing Damages With Pre and Post-Transit Characterizations of PV Modules

The solar photovoltaic (PV) industry often experiences module damage during transportation. PV modules stacked horizontally and strapped on wooden pallets may develop failures impacting their efficiency (glass shattering, cracks, frame indentation, etc.), especially when modules are not packed by professionals. The appearance of failures during the shipment from one laboratory to another can be detrimental to research studies. In this study, we tested a reusable plastic pallet designed to ship modules vertically. Five technologies of commercial PV modules were shipped together from Arizona to Florida including: glass/glass bifacial modules (framed and frameless), glass/transparent backsheet bifacial modules and glass/white backsheet modules (framed). Each module technology has a different physical size. Some modules had pre-existing cell-cracks allowing for the study of cell-crack formation and propagation during shipment. Dark current-voltage (I-V), light I-V and electroluminescence characterization were performed before and after shipment. A datalogger was used to monitor shocks and ambient temperature throughout the shipment and identify when the modules were more susceptible to damage. The modules were tilted upon receipt and the pallet were damaged but with no shattered modules. Time series shock data provided by the datalogger were used to determine potential responsible events. Our results reveal a few new post-transportation cracks for some modules. Modules parameters before and after shipment are also compared regarding the module constructions and their position in the pallet.

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DOE OSTI2023

Voltage mapping and local defects identification in solar cells using non-contact method

Electroluminescence, infrared imaging, and current–voltage curve techniques are used to detect and map underperforming cells in a photovoltaic module or the modules in a photovoltaic string. In this work, we present a non-contact electrostatic voltmeter technique to detect and map the underperforming spots in a cell and the cells in a module. This non-contact technique directly maps the charged surface voltage (671mV) of the superstrate glass, and it had an 11-mV difference with the voltmeter values (660mV). Another data set of voltage values obtained by electroluminescence images conversion into a voltage map showed a difference of 7mV with the non-contact voltmeter values. Further, the direct voltage values obtained at various good and poor-performing spots of the cells using this technique are 3.69V and 3.79V and are validated using the voltage values obtained in electroluminescence analysis and the difference in voltage obtained by the two techniques is determined to be less than 2%. In this work, we combine the strengths of two complementary techniques of the electrostatic voltmeter (strength: quantitative) and electroluminescence (strength: spatial mapping) to obtain a quantitative spatial mapping of defects. Furthermore, this work is extendable to detect the poor-performing modules in solar PV power plants.

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DOE OSTI2023

Potential induced degradation in c-Si glass-glass modules after extended damp heat stress

Traditional Glass-Backsheet (GB) photovoltaic (PV) modules have been the industry standard for a long time, but the Glass-Glass (GG) modules are quickly rising in popularity. PV modules installed in hot-humid climates with high string voltages can undergo potential induced degradation (PID). So far, to the best of our knowledge, only fresh modules with strong interfacial adhesion have been investigated for PID. However, in reality, the PV modules have weak interfacial adhesion after a few years of field exposure. Therefore, it is essential to evaluate PV modules with weakened interfaces. In this study, we investigated the PID susceptibility of PV modules with weakened interfaces after subjecting them to 2000 hours of damp heat (DH2000) at 85°C/85% relative humidity (RH) in an accelerated environmental chamber. Fresh GG modules were also stressed for PID to compare with PID degradation of DH-stressed modules. Pre- and post-characterization tests were done before, between, and after each stress method to determine the changes in electrical performance, cell metallization properties, and hotspot properties. It is observed that fresh GG modules showed little/no degradation (less than 1%) in maximum power (Pmax), whereas the GG modules that underwent sequential DH and PID degraded by 11% to 12%. Potential mechanisms for these degradations are also presented. Furthermore, the results presented in this study are critical for the industry, considering that the bifacial modules with GG construction will be dominant in the next 10 years.

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DOE OSTI2023

Use of non-contact voltmeter to quantify potential induced degradation in CdTe modules

Potential induced degradation (PID) is a significant reliability issue for photovoltaic modules in the field. Conventionally, to detect the PID-affected modules, all the modules in a string are individually disconnected and measured using I-V (current–voltage) tracers. It is extremely time-consuming, expensive and unsafe (if the module connectors are field aged) approach. In our approach, we aim detecting the PID-affected modules quickly, inexpensively and safely without disconnecting individual modules in the string. In this study, contactless electrostatic voltmeter’s (ESV) strength was explored to detect the PID-affected cadmium telluride (CdTe) modules in a string. These contactless measurements on high-voltage PV strings could make this technique unique and preferable to detect PID-affected modules in a string compared to the I-V curve method. In this work, a CdTe module was stressed for PID using the Aluminum (Al) foil method in a walk-in environmental chamber, which resulted in a reduction of module's peak current (I max ), peak voltage (Vmax), and fill factor (FF), and hence power (Pmax). Outdoor light I-V, EL, and ESV measurements were performed pre- and post-PID to determine the effectiveness of the non-contact ESV technique. Further, the ESV technique successfully detected the change in V max , and hence Pmax, compared to the pre-and post-PID conditions. A difference of less than 2% was observed in the results of the non-contact and non-interruptive method compared to the conventionally used interruptive voltmeter or I-V tracer method. This technique and the test results demonstrate a significant promise to identify poor-performing modules in PV string without disconnection of individual modules in the string.

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DOE OSTI2021

Multiscale Characterization of Photovoltaic Modules—Case Studies of Contact and Interconnect Degradation

The current popularity of photovoltaic (PV) systems is due in large part to their exceptional reliability and significantly lower cost than other energy sources. Studying cell and module degradation is key to promote further development in the state of the art. Fielded or accelerated aged modules exhibit different failure modes, of which metallization degradation (contacts and interconnections) is prevalent. In this work, we discuss how multiscale characterization methods can be applied to a variety of module technologies that have been field exposed and have undergone accelerated age testing. These methods include performing characterization on the module level, cell level, and finally the materials level. The observed performance losses from the module- and cell-level characterization can be correlated with materials properties to find out the root cause of degradation. We recommend an initial nondestructive characterization suite, including module- and cell-level current-voltage ( I--V ), Suns-V OC , photoluminescence and electroluminescence imaging, quantum efficiency, ultraviolet fluorescence imaging, and thermal infrared imaging. Samples are then extracted from particularly degraded regions of the module and prepared for materials characterization techniques, such as top-down and cross-sectional scanning electron microscopy, energy-dispersive X-ray spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectrometry, Raman spectroscopy, and transmission electron microscopy, allowing a deeper look into the mechanism behind the metallization degradation. This article serves as an instructional review to introduce the different multiscale characterization methods and how they can be effectively applied to perform PV degradation studies. Furthermore, we also share some of our examples and discuss the strengths, limitations, and best practices for each of the characterization techniques.

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DOE OSTI2020

Damp Heat Induced Degradation of Silicon Heterojunction Solar Cells With Cu-Plated Contacts

Damp heat exposure is one of the most stringent environments for testing the durability of solar cells in packaged modules. Damp heat stresses and induces a variety of degradation modes in solar cells and modules: for example, moisture-induced corrosion of electrodes and interconnections, deterioration of polymeric materials, and/or thermally activated diffusion processes. To screen for these and other potential degradation modes, we subject one-cell modules containing silicon heterojunction (SHJ) solar cells with Cu-plated contacts to extended damp heat tests at 85 °C/85% relative humidity. SHJ cells were laminated with two common encapsulants: ethylene vinyl acetate (EVA) and polyolefin elastomer (POE), and two constructions: glass-backsheet and glass-glass. We observe degradation in all components of solar cell maximum power (PMP): current, voltage, and fill factor, and find evidence of increased carrier recombination and nonideal diode behavior with increasing stress. For glass-backsheet constructions, EVA samples generally degrade more than POE by a factor of approximately 1.5x PMP, and the different encapsulants produce different degradation patterns. Similar trends are observed in glass-glass modules, but to a lesser degree. In a different experiment, we observe a decrease in effective minority carrier lifetime of nonmetallized SHJ precursors measured after damp heat. This implies that some degradation unrelated to the contacts is to be expected and confirms the observation of increasing recombination.

14 SOLAR ENERGY↗

DOE OSTI2020

The 2020 photovoltaic technologies roadmap

Over the past decade, the global cumulative installed photovoltaic (PV) capacity has grown exponentially, reaching 591 GW in 2019. Rapid progress was driven in large part by improvements in solar cell and module efficiencies, reduction in manufacturing costs and the realization of levelized costs of electricity that are now generally less than other energy sources and approaching similar costs with storage included. Given this success, it is a particularly fitting time to assess the state of the photovoltaics field and the technology milestones that must be achieved to maximize future impact and forward momentum. This roadmap outlines the critical areas of development in all of the major PV conversion technologies, advances needed to enable terawatt-scale PV installation, and cross-cutting topics on reliability, characterization, and applications. Each perspective provides a status update, summarizes the limiting immediate and long-term technical challenges and highlights breakthroughs that are needed to address them. In total, this roadmap is intended to guide researchers, funding agencies and industry in identifying the areas of development that will have the most impact on PV technology in the upcoming years.

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