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Sinclair, Josiah (ORCID:0000000215238295)

Publications and source records attributed to Sinclair, Josiah (ORCID:0000000215238295).

Fault-tolerant optical interconnects for neutral-atom arrays

We analyze the use of photonic links to enable large-scale fault-tolerant connectivity of locally error-corrected modules based on neutral atom arrays. Our approach makes use of recent theoretical results showing the robustness of surface codes to boundary noise and combines recent experimental advances in atom-array quantum computing with logical qubits with optical quantum networking techniques. We find the conditions for fault tolerance can be achieved with local two-qubit Rydberg gate and nonlocal Bell-pair errors below 1% and 10%, respectively, without requiring distillation or space-time overheads. Realizing the interconnects with a lens, a single optical cavity, or an array of cavities enables—with sufficient multiplexing—a Bell-pair generation rate in the 1–50 MHz range. When directly interfacing logical qubits, this rate translates to error-correction cycles in the 25–2000 kHz range, satisfying all requirements for fault tolerance and in the upper range fast enough for 100 kHz logical clock cycles. Published by the American Physical Society 2025

Sinclair, Josiah (ORCID:0000000215238295)↗

Degradation of Ta 2 O 5 / SiO 2 dielectric cavity mirrors in ultra-high vacuum

In order for optical cavities to enable strong light-matter interactions for quantum metrology, networking, and scalability in quantum computing systems, their mirrors must have minimal losses. However, high-finesse dielectric cavity mirrors can degrade in ultra-high vacuum (UHV), increasing the challenges of upgrading to cavity-coupled quantum systems. We observe the optical degradation of high-finesse dielectric optical cavity mirrors after high-temperature UHV bake in the form of a substantial increase in surface roughness. We provide an explanation of the degradation through atomic force microscopy (AFM), X-ray fluorescence (XRF), selective wet etching, and optical measurements. We find the degradation is explained by oxygen reduction in Ta 2 O 5 followed by growth of tantalum sub-oxide defects with height to width aspect ratios near ten. We discuss the dependence of mirror loss on surface roughness and finally give recommendations to avoid degradation to allow for quick adoption of cavity-coupled systems.

Optics↗