Thermal noise measurements on space-charge-limited hole current in silicon.
Explore the source record for details and available documents.
Engineering topics
Publications and source records attributed to Shumka, A..
Explore the source record for details and available documents.
Present theories on noise in single-carrier space-charge-limited currents in solids have not been quantitatively substantiated by experimental evidence. To obtain such experimental verification, the noise in specially fabricated silicon structures is being measured and analyzed. The first results of this verification effort are reported.
Noise, admittance and I-V characteristics of hot holes in space charge limited Ge diodes at high voltage and frequencies to 22 MHz
Thermal noise in space charge limited solid state diodes with field dependent mobility and hot carriers
Thermal noise in space charge limited solid state diodes by Langevin equation, relating spectral intensity for open and short circuit voltage and current
Temperature effects on Si solar cell short circuit currents, considering solar spectrum, photon absorption coefficient and diffusion length
Germanium solid state triode controlling electron currents of space charge limited regime by means of gate conductors in solid state diode
Theoretical model for predicting performance of thin base solid state diode in low current range