Catastrophic SEE in high-voltage power MOSFETs
Heavy ion irradiation of high-voltage power MOSFETs with long-range ions was performed using 14, 19, 22, 24, 28 and 39 MeV-cm2/mg ions.
MOSFET↗
Engineering topics
Selva, L. E.
Publications and source records attributed to Selva, L. E..
Experimental techniques for SEE tests at low temperatures
Explore the source record for details and available documents.
cryogenics SEE↗
Observations on ion track structure in semiconductors : a phenomenological study
An ion track structure model at the nanometer scale is presented. The model is based on electrostatic principles and is supported by observed experimental results conducted on power MOSFETs. The model predicts the existence of a transient induced electric field following the passage of an energetic heavy ion. There are two segments to the field (a radial and an axial component). It is the interaction of this transient electric field with the local environment that can trigger a catastrophic failure.
SEGR↗
Compendium of Single Event Failures in Power MOSFETs
This compendium of SEGR and SEB data organizes results from several laboratories comparing failure thresholds for several different manufacturers and technologies. The results of this compendium are aimed at the designer to show the possible variations between manufacturers and processes.
Single Event Failures MOSFETs SEGR SEB↗
Proton Degradation of Light-Emitting Diodes
The severe degradation of optocouplers in space has been shown to be mainly due to proton displacement damage in the light-emitting diodes that are used within the optocouplers. However, a variety of LED technologies can be used in optocouplers and their sensitivity to proton displacement damage varies by about two orders of magnitude. Optocouplers are very simple hybrid devices, and the type of LED can be readily changed by the manufacturers with little cost impact. many optocoupler manufacturers purchase LEDs from outside sources with little knowledge or control of the manufacturing process used for the LED, leading to the possibility of very dramatic differences in radiation response (JPL has observed such differences for one type of optocoupler that is used in a hybrid power converter).
Johnston, A. H.↗