Total Ionizing Dose Effects on Gallium Oxide MOSFETs
Poster showing TID data on AFRL Ga2O3 MOSFETs, the mechanisms behind the effects, and some simulations in TCAD
Cadena, Rick [Vanderbilt University]↗
Engineering topics
Schrimpf, Ronald [Vanderbilt University]
Publications and source records attributed to Schrimpf, Ronald [Vanderbilt University].