Engineering topics
Publications and source records attributed to Scheick, L..
This guideline is written to help facilitate adoption of COTS components by space flight projects by elucidating the radiation effects that various types of components are susceptible to, by describing potential mitigations, and by recommending component selection strategies that minimize radiation risks.
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This paper reports the investigation findings concerning of the EEPROM single bit failures that were observed on a recent NASA space mission.
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SEU cross-sections were obtained for two different FeRAM memories: The 64 kbit and 256 kbit Ramtron FeRAM and the Hynix 64 kbit device. The devices were seen to have latch-up characteristics typical of commercial CMOS. Also, errors in the memory were also seen from heavy ion irradiation.
A new method using an array of MOS transistors formeasuring dose absorbed from ionizing radiation is compared to previous dosimetric methods., The accuracy and precision of dosimetry based on COTS SRAMs, DRAMs, and WPROMs are compared and contrasted. Applications of these devices in various space missions will be discussed. TID results are presented for this summary and microdosimetricresults will be added to the full paper. Finally, an analysis of the optimal condition for a digital dosimeter will be presented.
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