Quantum circuit debugging and sensitivity analysis via local inversion.
Abstract not provided.
Calderon Vargas, Fernando↗
Engineering topics
Rudinger, Kenneth
Publications and source records attributed to Rudinger, Kenneth.
Characterizing Midcircuit Measurements on a Superconducting Qubit Using Gate Set Tomography
Measurements that occur within the internal layers of a quantum circuit—midcircuit measurements—are a useful quantum-computing primitive, most notably for quantum error correction. Midcircuit measurements have both classical and quantum outputs, so they can be subject to error modes that do not exist for measurements that terminate quantum circuits. In this work, we show how to characterize midcircuit measurements, modeled by quantum instruments, using a technique that we call quantum instrument linear gate set tomography (QILGST). We then apply this technique to characterize a dispersive measurement on a superconducting transmon qubit within a multiqubit system. By varying the delay time between the measurement pulse and subsequent gates, we explore the impact of residual cavity photon population on measurement error. QILGST can resolve different error modes and quantify the total error from a measurement; in our experiment, for delay times above 1000 ns we measure a total error rate (i.e., half diamond distance) of ϵ$\diamond$ = 8.1 ± 1.4%, a readout fidelity of 97.0 ± 0.3%, and output quantum-state fidelities of 96.7 ± 0.6% and 93.7 ± 0.7 % when measuring 0 and 1, respectively.
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
Measuring the capabilities of quantum computers
Quantum computers can now run interesting programs, but each processor’s capability—the set of programs that it can run successfully—is limited by hardware errors. These errors can be complicated, making it difficult to accurately predict a processor’s capability. Benchmarks can be used to measure capability directly, but current benchmarks have limited flexibility and scale poorly to many-qubit processors. We show how to construct scalable, efficiently verifiable benchmarks based on any program by using a technique that we call circuit mirroring. With it, we construct two flexible, scalable volumetric benchmarks based on randomized and periodically ordered programs. We use these benchmarks to map out the capabilities of twelve publicly available processors, and to measure the impact of program structure on each one. We find that standard error metrics are poor predictors of whether a program will run successfully on today’s hardware, and that current processors vary widely in their sensitivity to program structure.
97 MATHEMATICS AND COMPUTING↗
Experimental Characterization of Crosstalk Errors with Simultaneous Gate Set Tomography
Not Available
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
Gate Set Tomography
Gate set tomography (GST) is a protocol for detailed, predictive characterization of logic operations (gates) on quantum computing processors. Early versions of GST emerged around 2012-13, and since then it has been refined, demonstrated, and used in a large number of experiments. This paper presents the foundations of GST in comprehensive detail. The most important feature of GST, compared to older state and process tomography protocols, is that it is calibration-free . GST does not rely on pre-calibrated state preparations and measurements. Instead, it characterizes all the operations in a gate set simultaneously and self-consistently, relative to each other. Long sequence GST can estimate gates with very high precision and efficiency, achieving Heisenberg scaling in regimes of practical interest. In this paper, we cover GST's intellectual history, the techniques and experiments used to achieve its intended purpose, data analysis, gauge freedom and fixing, error bars, and the interpretation of gauge-fixed estimates of gate sets. Our focus is fundamental mathematical aspects of GST, rather than implementation details, but we touch on some of the foundational algorithmic tricks used in the pyGSTi implementation.
97 MATHEMATICS AND COMPUTING↗
Efficient flexible characterization of quantum processors with nested error models
We present a simple and powerful technique for finding a good error model for a quantum processor. The technique iteratively tests a nested sequence of models against data obtained from the processor, and keeps track of the best-fit model and its wildcard error (a metric of the amount of unmodeled error) at each step. Each best-fit model, along with a quantification of its unmodeled error, constitutes a characterization of the processor. We explain how quantum processor models can be compared with experimental data and to each other. We demonstrate the technique by using it to characterize a simulated noisy two-qubit processor.
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗