Engineering topics
Publications and source records attributed to Ross, R., Jr..
Experiments were performed to quantify the effect of contamination in the helium working gas of a typical pulse tube cryocooler operating at 60 K with 1 W of applied heating load.
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Explore the source record for details and available documents.
Explore the source record for details and available documents.
Spacecraft instruments requiring cryocoolers in their design struggle to keep overall power requirements in line with feasible solar array dimensions.
This paper presents the results of studies that provide an overview of expected sensitivities to cycle rate, temperature, lead stiffness, and strain-cycle depth.
This paper presents the fundamental equations governing cyocooler mechanical efficiency and launch vibration response in terms of their implications for cooler design.
The electrochemical and galvanic corrosion properties of thin-film photovoltaic (TF-PV) modules and module subcomponents are determined and interpreted in the light of established corrosion science. Results of a detailed study of thin-film aluminum metallization corrosion are presented. Bar-graph corrosion, observed in fielded modules, has been induced experimentally and found to be electrochemical in nature. Corrosion rates and passivation techniques for TF-PV modules are discussed.
Electromigration as a possible thin-film module failure mechanism was investigated using several specially made, fully aluminized thin-film photovoltaic (TF-PV) modules. The effect of electromigration, as determined experimentally by measuring increases in electrical resistance across scribe lines, can be expressed as the product of a damage function, which correlates degradation rate with operating conditions such as current density and temperature, and a susceptibility function, which is defined by module design parameters, particularly aluminum purity and the configuration of the intercell region. Experimental measurements and derived acceleration factors suggest that open-circuit failure resulting from electromigration should not be a serious problem in present state-of-the-art TF-PV modules. Nevertheless, significant intercell resistance increases can result from long-term electromigration exposure, especially in future high-efficiency modules. The problem can be alleviated, however, by appropriate metallization applications and/or proper design of the intercell region.
Mechanisms by which moisture enters photovoltaic modules and techniques for reducing such interactions are reported. Results from a study of the effectiveness of various module sealants are given. Techniques for measuring the rate and quantity of moisture ingress are discussed. It is shown that scribe lines and porous frit bridging conductors provide preferential paths for moisture ingress and that moisture diffusion by surface/interfacial paths is considerably more rapid than diffusion by bulk paths, which implies that thin-film substrate and supersubstrate modules are much more vulnerable to moist environments than are bulk-encapsulated crystalline-silicon modules. Design approaches that reduce moisture entry are discussed.
Results are reported of studying the interaction of moisture with photovoltaic (PV) modules and custom-built test coupons in both laboratory and outdoor ambient environments. Characteristics measured included module cell-to-frame leakage currents, encapsulant bulk and surface currents, glass surface currents, and encapsulant/glass interface currents as functions of temperature and humidity. Using a computer model of interelectrode conduction, preferential conduction paths in PVB- and EVA-encapsulated modules are identified. In comparing the results of field and laboratory test environments on identical samples, comments are made about the greater severity of the outdoor environment. Several aspects of water-module interaction, including design strategies and continuing research, are discussed.