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Ross, J. B.

Publications and source records attributed to Ross, J. B..

An easy-to-use diagnostic system development shell

The Diagnostic System Development Shell (DSDS), an expert system development shell for diagnostic systems, is described. The major objective of building the DSDS is to create a very easy to use and friendly environment for knowledge engineers and end-users. The DSDS is written in OPS5 and CommonLisp. It runs on a VAX/VMS system. A set of domain independent, generalized rules is built in the DSDS, so the users need not be concerned about building the rules. The facts are explicitly represented in a unified format. A powerful check facility which helps the user to check the errors in the created knowledge bases is provided. A judgement facility and other useful facilities are also available. A diagnostic system based on the DSDS system is question driven and can call or be called by other knowledge based systems written in OPS5 and CommonLisp. A prototype diagnostic system for diagnosing a Philips constant potential X-ray system has been built using the DSDS.

Tsai, L. C.

Design and use of multiple blade slurry sawing in a production atmosphere

The technique and uses of the multiple blade slurry (MBS) saw are considered. Multiple bands of steel are arranged in a frame and the frame is reciprocated with the steel bands to a workpiece, while simultaneously applying abrasive at the point of contact. The blades wear slots in the workpiece and progress through the piece resulting in several parts of wafers. The transition to MBA from diamond slicing is justified by savings resulting from minimized kerf losses, minimized subsurface damage, and improved surface quality off the saw. This allows wafering much closer to finished thickness specifications. The current state of the art MBS technology must be significantly improved if the low cost solar array (LSA) goals are to be attained. It is concluded that although MBS will never be the answer to every wafering requirement, the economical production of wafers to LSA project specifications will be achieved.

Lynah, F. P., Jr.