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Roberson, F. I.

Publications and source records attributed to Roberson, F. I..

Apollo 15 orbital science summary.

In this paper, summary results of the Apollo 15 orbital science payload are given, and some quick-look results of Apollo 16 are discussed. Geochemical instruments, consisting of gamma-ray, X-ray, and alpha particle spectrometers, have provided a chemical map of the lunar surface flown over by Apollo 15. The Laser Altimeter and frontside gravity data have shown some unexpected results with regard to the lunar shape, and provided new basis for understanding lunar mascons. A magnetometer, aboard the small subsatellite, has located magnetic anomalies principally on the lunar farside, and has shown that the small lunar magnetic field is smoother on the frontside than on the back. The mass spectrometer, in orbit aboard the Command and Service Modules, has measured unexpectedly large populations of molecules at orbital altitude (110 km), mostly due to spacecraft contamination. Two major camera systems have provided the first systematic metric quality photography and concurrent high resolution stereo coverage of the lunar surface.

Esenwein, G. F.

Apollo lunar orbital science.

The Apollo 15 and 16 experiments are discussed. The formal scientific experiments conducted in lunar orbit are listed in an appendix. The gamma ray spectrometer performed a compositional survey of the upper 30 cm of the lunar surface by observing the gamma rays emitted during the radioactive decay of naturally occurring radioisotopes and their daughter products, and of the radioisotopes produced by cosmic ray bombardment of lunar surface materials. The results from the Apollo 15 X-ray spectrometer have shown excellent correlation between returned samples and gross lunar features. The various systems and experiments are described in detail.

Roberson, F. I.

Apollo in lunar orbit

Apollo lunar orbital missions, discussing remote sensing and photographic equipment for lunar sounding and mass spectrometry, gegenschein experiments and high quality metric photography

Esenwein, G. F.