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Reed, R.

Publications and source records attributed to Reed, R..

14 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2023

Detector requirements and simulation results for the EIC exclusive, diffractive and tagging physics program using the ECCE detector concept

This article presents a collection of simulation studies using the ECCE detector concept in the context of the EIC’s exclusive, diffractive, and tagging physics program, which aims to further explore the rich quark–gluon structure of nucleons and nuclei. To successfully execute the program, ECCE proposed to utilize the detector system close to the beamline to ensure exclusivity and tag ion beam/fragments for a particular reaction of interest. Preliminary studies confirm the proposed technology and design satisfy the requirements. Further, the projected physics impact results are based on the projected detector performance from the simulation at 10 or 100 fb -1 of integrated luminosity. Additionally, insights related to a potential second EIC detector are documented, which could serve as a guidepost for future development.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
DOE OSTI2021

Quality assurance test of silicon photomultipliers and electronic boards for STAR event plane detector

The event plane detector (EPD), installed in the Solenoid Tracker at the Relativistic Heavy-Ion Collider located at the Brookhaven National Laboratory is a plastic scintillator-based device that measures the reaction centrality and event plane in the forward region of the relativistic heavy-ion collisions. We used silicon photomultiplier (SiPM) arrays to detect the photons produced in the scintillator via the fiber connection. Signals from the SiPM arrays were amplified by the front-end electronic (FEE) board, and sent to the analog-to-digital converter (ADC) boards for further processing via the receiver (RX) board. The full EPD system consisted of 24 super-sectors (SSs); each SS was equipped with two SiPM boards, two FEE boards and two RX boards, and they corresponded to 744 readout channels. All these boards were mass produced at the University of Science and Technology of China, with a dedicated quality assurance (QA) procedures applied to identify any problems before deployment. This article describes the details of the QA method and the related test system. As a result, the QA test results are presented along with the discussions.

EPD↗
DOE OSTI2020

The STAR event plane detector

The Event Plane Detector (EPD) is an upgrade detector to the STAR experiment at RHIC, designed to measure the pattern of forward-going charged particles emitted in a high-energy collision between heavy nuclei. It consists of two highly-segmented disks of 1.2-cm-thick scintillator embedded with wavelength-shifting fiber, coupled to silicon photomultipliers and custom electronics. Finally, we describe the general design of the device, its construction, and performance on the bench and in the experiment.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
NASA NTRS2016

Goal Structuring Notation in a Radiation Hardening Assurance Case for COTS-Based Spacecraft

A systematic approach is presented to constructing a radiation assurance case using Goal Structuring Notation (GSN) for spacecraft containing COTS parts. The GSN paradigm is applied to an SRAM single-event upset experiment board designed to fly on a CubeSat in January 2017. A custom software language for development of a GSN assurance case is under development at Vanderbilt. Construction of a radiation assurance case without use of hardened parts or extensive radiation testing is discussed.

Radiation Effects Modeling (REM)↗
DOE OSTI2015

New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle

In this study, we present low-energy proton single-event upset (SEU) data on a 65 nm SOI SRAM whose substrate has been completely removed. Since the protons only had to penetrate a very thin buried oxide layer, these measurements were affected by far less energy loss, energy straggle, flux attrition, and angular scattering than previous datasets. The minimization of these common sources of experimental interference allows more direct interpretation of the data and deeper insight into SEU mechanisms. The results show a strong angular dependence, demonstrate that energy straggle, flux attrition, and angular scattering affect the measured SEU cross sections, and prove that proton direct ionization is the dominant mechanism for low-energy proton-induced SEUs in these circuits.

74 ATOMIC AND MOLECULAR PHYSICS↗
DOE OSTI2015

The contribution of low-energy protons to the total on-orbit SEU rate

Low- and high-energy proton experimental data and error rate predictions are presented for many bulk Si and SOI circuits from the 20-90 nm technology nodes to quantify how much low-energy protons (LEPs) can contribute to the total on-orbit single-event upset (SEU) rate. Every effort was made to predict LEP error rates that are conservatively high; even secondary protons generated in the spacecraft shielding have been included in the analysis. Across all the environments and circuits investigated, and when operating within 10% of the nominal operating voltage, LEPs were found to increase the total SEU rate to up to 4.3 times as high as it would have been in the absence of LEPs. Therefore, the best approach to account for LEP effects may be to calculate the total error rate from high-energy protons and heavy ions, and then multiply it by a safety margin of 5. If that error rate can be tolerated then our findings suggest that it is justified to waive LEP tests in certain situations. Trends were observed in the LEP angular responses of the circuits tested. As a result, grazing angles were the worst case for the SOI circuits, whereas the worst-case angle was at or near normal incidence for the bulk circuits.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
NASA NTRS2006

Guidelines for Design and Test of a Built-In Self Test (BIST) Circuit For Space Radiation Studies of High-Speed IC Technologies

Serial Bit Error Rate Testing under radiation to characterize single particle induced errors in high-speed IC technologies generally involves specialized test equipment common to the telecommunications industry. As bit rates increase, testing is complicated by the rapidly increasing cost of equipment able to test at-speed. Furthermore as rates extend into the tens of billions of bits per second test equipment ceases to be broadband, a distinct disadvantage for exploring SEE mechanisms in the target technologies. In this presentation the authors detail the testing accomplished in the CREST project and apply the knowledge gained to establish a set of guidelines suitable for designing arbitrarily high speed radiation effects tests.

Carts, M. A.↗
NASA NTRS2002

Recent photonics activites under the NASA electronic parts and packaging (NEPP) program

With the rapidly increasing insertion of photonic devices, circuits and subsystems into NASA spacecraft, a variety of issues associated with reliability and radiation tolerance have arisen. In this paper, we discuss these issues from the perspective of the work currently ongoing in the NASA Electronic Parts and Packaging (NEPP) Program. This Program is focused on evaluating the reliability and radiation response of advanced and emerging microelectronics and photonics technologies of interest to NASA spacecraft system designers.

NEEP↗
NASA NTRS1998

Current Radiation Issues for Programmable Elements and Devices

The purpose of this presentation is to discuss the COTS performance, clock upset / single event transient, device configuration upset, antifuse hardening, heavy ion SEU, total dose, proton sensitivities, latchup, and additional information and data.

Katz, Richard↗
NASA NTRS1994

High elongation elastomers

A new class of liquid curable elastomers with unusual strength and elasticity has been developed at the Naval Air Warfare Center Weapons Division, China Lake. Over the years, studies have been conducted on polymer structure and its influence on the mechanical properties of the ensuing composites. Different tools, including nuclear magnetic resonance, have been used. This paper presents a summary of the factors controlling the mechanical behavior of composites produced with the new liquid curable elastomers, including the effects of plasticizers. It also provides an overview of the nuclear magnetic resonance study on polymer structure, the composition and properties of some live and inert formulations produced at China Lake, and some possible peace-time applications for these new elastomeric materials.

Brady, V. L.↗