Engineering topics

Ralf K Heilmann

Publications and source records attributed to Ralf K Heilmann.

3 records

NASA NTRS2020

Progress of Coating Stress Compensation of Silicon Mirrors for Lynx X-ray Telescope Mission Concept Using Thermal Oxide Patterning Method

A thermal oxide patterning method has proven to be effective for correcting coating-stress-induced distortion on flat silicon wafers. We report progress on developing this method for correcting curved silicon mirrors distorted by front-side iridium coatings. Owing to the difference in geometry, a finite element model has been established to calculate the appropriate duty cycle maps in thermal oxide hexagon patterns used for compensation. In addition, a photolithographic process, along with three-dimensional printed equipment, has been developed for creating patterns precisely on the back side of curved mirrors. The developed method has been used to recover the original surface shape of two silicon mirrors which are 100-mm long, 0.5-mm thick, having 312-mm radius of curvature, and 30 deg in azimuthal span (Wolter-I geometry). These mirrors’ front sides are sputter-coated by 20-nm iridium layers with ∼-70 N∕m integrated stress. Measurement results show that the developed method can mitigate coating-induced distortion by a factor of ∼5 in RMS height and ∼4 in RMS slope error, corresponding to ∼0.5 arc sec RMS slope error. Residual errors after correction are dominated by midfrequency ripples created during the annealing process, which will be resolved in the future. The presented method is precise and inexpensive and a potential candidate for resolving the coating stress issue for Lynx optics in the future.

x-ray↗

NASA NTRS2019

Arcus: The Soft X-ray Grating Explorer

Arcus provides high-resolution soft X-ray spectroscopy in the 12-50 Å bandpass with unprecedented sensitivity, including spectral resolution > 2500 and effective area > 250 cm2. The three top science goals for Arcus are (1) to measure the effects of structure formation imprinted upon the hot baryons that are predicted to lie in extended halos around galaxies, (2) to trace the propagation of outflowing mass, energy, and momentum from the vicinity of the black hole to extragalactic scales as a measure of their feedback, and (3) to explore how stars form and evolve. Arcus uses the same 12 m focal length grazing-incidence Silicon Pore X-ray Optics (SPOs) that ESA has developed for the Athena mission; the focal length is achieved on orbit via an extendable optical bench. The focused X-rays from these optics are diffracted by high-efficiency Critical-Angle Transmission (CAT) gratings, and the results are imaged with flight-proven CCD detectors and electronics. Combined with the high-heritage NGIS LEOStar-2 spacecraft and launched into 4:1 lunar resonant orbit, Arcus provides high sensitivity and high efficiency observing of a wide range of astrophysical sources.

Randall K Smith↗

NASA NTRS2016

Toward Large-Area Sub-Arcsecond X-Ray Telescopes II

In order to advance significantly scientific objectives, future x-ray astronomy missions will likely call for x-ray telescopes with large aperture areas (approx. = 3 sq m) and fine angular resolution (approx. = 1"). Achieving such performance is programmatically and technologically challenging due to the mass and envelope constraints of space-borne telescopes and to the need for densely nested grazing-incidence optics. Such an x-ray telescope will require precision fabrication, alignment, mounting, and assembly of large areas (approx. = 600 sq m) of lightweight (approx. = 2 kg/sq m areal density) high-quality mirrors, at an acceptable cost (approx. = 1 M$/sq m of mirror surface area). This paper reviews relevant programmatic and technological issues, as well as possible approaches for addressing these issues-including direct fabrication of monocrystalline silicon mirrors, active (in-space adjustable) figure correction of replicated mirrors, static post-fabrication correction using ion implantation, differential erosion or deposition, and coating-stress manipulation of thin substrates.

Shi Ye↗